Semiconductor

Semiconductor

전체
Photo Response Tester
Spectral Quantum Efficiency Tester
Long-term Reliability Tester

Spectral Quantum Efficiency Tester

  • EQE Test System For Solar Cell & Photo device
  • Tandem Solar Cell EQE Test
  • Wide wavelength range
  • Multi Wavelength bias light source
  • Electric bias source for tandem solar cell
  • Low Frequency Optical Chopping & Lock-In Amp
  • Test Report

Photo Response Tester

  • Photo Response Test
  • Cut off Frequency, Rise/Fall Tim
  • High Luminance Lag Measurement
  • Optical Impedance
  • Modulated Light Source : Square, sine
  • 530nm, 850nm Laser Diode
  • Data Report

Long-term Reliability Tester

  • 530nm, 850nm Laser Diode
  • Automatic X-Y Stage
  • Temperature Control Jig
  • QE Measurement
  • Dark I-V Measurement
  • Data Report
TNE TECH Co., Ltd. head office303, B-302, 357, Giheung-gu, Yongin-si, Gyeonggi-do
+82-31-299-2777 +82-31-624-1109 tne@tnetech.co.kr
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