TNE Tech Co., Ltd.

Semiconductor

Photo Response Tester

Spectral Quantum Efficiency Tester

Long-term Reliability Tester

: Spectral Quantum Efficiency Tester

EQE Test System For Solar Cell & Photo device

Tandem Solar Cell EQE Test

Wide wavelength range

Multi Wavelength bias light source

Electric bias source for tandem solar cell

Low Frequency Optical Chopping & Lock-In Amp

Test Report

: Photo Response Tester

Photo Response Test

Cut off Frequency, Rise/Fall Tim

High Luminance Lag Measurement

Optical Impedance

Modulated Light Source : Square, sine

530nm, 850nm Laser Diode

Data Report

: Long-term Reliability Tester

530nm, 850nm Laser Diode

Automatic X-Y Stage

Temperature Control Jig

QE Measurement

Dark I-V Measurement

Data Report

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